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1 article(s) from Zhang, Zaoli

Orientation of FePt nanoparticles on top of a-SiO₂/Si(001), MgO(001) and sapphire(0001): effect of thermal treatments and influence of substrate and particle size

Martin Schilling,
Paul Ziemann,
Zaoli Zhang,
Johannes Biskupek,
Ute Kaiser and
Ulf Wiedwald

Beilstein J. Nanotechnol. 2016, 7, 591–604, doi:10.3762/bjnano.7.52

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Figure 1: Cross-section HRTEM images of small (2–3 nm) FePt NPs on a MgO(001) substrate after annealing at 65...

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Figure 2: 3 nm thick FePt film on SiO₂/Si(001) substrate after annealing at 650 °C for 30 min: (a) RHEED patt...

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Figure 3: Example of an AFM image (left) and height histogram (right) of micellar FePt NPs on SiO₂/Si(001) af...

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Figure 4: RHEED patterns of 7.6 nm FePt NPs on SiO₂/Si(001) after different annealing steps (a) 570 °C for 60...

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Figure 5: (a–c) RHEED patterns of a FePt film on Al₂O₃(0001), recorded with an electron beam energy of 25 keV...

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Figure 6: RHEED images of FePt NPs on sapphire(0001) single crystals after several annealing steps, recorded ...

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Figure 7: (a–d) RHEED pattern of a FePt film on MgO(100), recorded with an electron beam energy of 25 keV aft...

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Figure 8: (a–c) RHEED patterns of large (5–6 nm) FePt nanoparticles prepared on MgO(001), recorded with an el...

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Figure 9: RHEED pattern of 2–3 nm FePt particles on MgO(001), recorded with an beam energy of 25 keV after an...

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Figure 10: AFM image and height histogram of 2–3 nm FePt nanoparticles on MgO(001) after annealing at 650 °C f...

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Published 21 Apr 2016

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Orientation of FePt nanoparticles on top of a-SiO2/Si(001), MgO(001) and sapphire(0001): effect of thermal treatments and influence of substrate and particle size

Orientation of FePt nanoparticles on top of a-SiO₂/Si(001), MgO(001) and sapphire(0001): effect of thermal treatments and influence of substrate and particle size